The SM series thermal shock test chamber makes it possible to quickly and autonomously transfer test items back and forth repeatedly between a hot and cold environment. Thermal shock testing is different from thermal cycling, the latter being a longer and slower process. To see a more
Dashboard view enables chamber control at the chamber, at a desktop, or remotely via laptop or tablet
Profile Builder has drag-and-drop, web-browser functionality
Data Logging with onboard, multi-year logging of live and current data, anyplace anytime
Communication and Control uses standard, well-documented JSON API for easy integration with other test platforms
Security decreases test interference with three authentication methods and six permission levels
Watlow F4T Programmable Controller
Features a 4.3” capacitive touchscreen minimizing the chance for error. Ethernet communication supported by AES|XCHANGE
100 OHM Platinum RTD is a highly-accurate sensor made from platinum components for increased sensitivity
We offer multiple types of safeties on our test chambers to help protect your product and your test chamber if anything malfunctions.
A heat fuse or thermal fuse, will interrupt the flow of electricity to the test chamber and shut it down if it reaches a certain temperature.
A digital set temperature safety that will shut down the test chamber if it goes over a certain temperature.
A digital set temperature safety that will shut down the test chamber if it goes over a certain temperature or below a certain temperature.
On the left are the test conditions for military and aerospace specifications creating a uniform method for thermal shock testing of microelectronic devices within electronic systems. Below the test condition is laid-out in a visualized graph.
These devices include monolithic, multi-chip, film and hybrid microcicuits, microcircuit arrays, and the elements from which the circuits and arrays are formed.