The SM series thermal shock test chamber makes it possible to quickly and autonomously transfer test items back and forth repeatedly between a hot and cold environment. Thermal shock testing is different from thermal cycling, the latter being a longer and slower process. To see a more
View Thermal Shock Chamber video here.
Dashboard view enables chamber control at the chamber, at a desktop, or remotely via laptop or tablet
Profile Builder has drag-and-drop, web-browser functionality
Data Logging with onboard, multi-year logging of live and current data, anyplace anytime
Communication and Control uses standard, well-documented JSON API for easy integration with other test platforms
Security decreases test interference with three authentication methods and six permission levels
Watlow F4T Programmable Controller
Features a 4.3” capacitive touchscreen minimizing the chance for error. Ethernet communication supported by AES|XCHANGE
100 OHM Platinum RTD is a highly-accurate sensor made from platinum components for increased sensitivity
We offer multiple types of safeties on our test chambers to help protect your product and your test chamber if anything malfunctions.
A heat fuse or thermal fuse, will interrupt the flow of electricity to the test chamber and shut it down if it reaches a certain temperature.
A digital set temperature safety that will shut down the test chamber if it goes over a certain temperature.
A digital set temperature safety that will shut down the test chamber if it goes over a certain temperature or below a certain temperature.
On the left, the table specifies the test conditions the SM Thermal Shock test chamber can achieve under the military and aerospace conditions to adhere to the uniform method for thermal shock testing of microelectronic devices within electronic systems. These devices include monolithic, multi-chip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed.
SM Thermal Shock test chambers are designed to meet Method 107 test conditions A, B, and F when testing electronic and electrical component parts such items as capacitors, resistors, switches, relays, transformers, inductors, and such at weights of 10 or 5 pounds, see table (left).
The test method should apply only to small component parts, weighing up to 300 pounds or having a root mean square test voltage up to 50,000 volts unless otherwise specified.