The handbook illustrates two test methods for predicting the reliability of electronic equipment. AES Test Chambers apply to many of the environmental scenarios found in this guide. The reliability method used is determined by how much information is available. The first method is the "Parts Count Method," which is applied early on in the design phase where less information is known and usually results in a more conservative estimate, or a higher failure rate. The second method being, "Part Stress Analysis," used later in the design process, when the information about actual parts is in the design.
Establishes uniform methods for testing electronic and electrical component parts, including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military operations, and physical and electrical tests. These cover temperature, humidity, and salt variations.
Test Methods for Semiconductor Devices outlines test conditions, including temperature variations in environmental test chambers.
Accelerates corrosion in a laboratory by simulating the effects of seacoast atmosphere on semiconductor devices. This test method can also detect the presence of free iron contaminating the surface of another metal, by inspection of the corrosion products.